JEOL: Launch of the FIB-SEM System “JIB-PS500i” with High Precision an…

JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces its launch of the FIB-SEM system “JIB-PS500i” on February 1, 2023. With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) in the semiconductor industry as well as in the battery and materials fields, “highe...