JEOL: Release of a New Schottky Field Emission Scanning Electron Micro…

JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-IT800 in May 2020. Development Background Scanning electron microscopes (SEMs) are used in various fields, such as nanotechnology, metals, semiconductors, ceramics, medicine, and biology. As SEM applications are expanding from research and development to quality control and product inspection at manufacturing sites, SEM users are in need of faster high-...